Quickly Scan One Stop To The Bottom Of The Optical Power Meter

Quickly Scan One Stop To The Bottom Of The Optical Power Meter

The core advantage of the rapid scanning one-stop optical power meter lies in its ability to achieve "one-stop" rapid scanning measurement of optical power through high-speed acquisition, large dynamic range and multi-channel design.

Testing of passive optical devices
Scene: Insertion loss (IL) and polarization-dependent loss (PDL) tests of devices such as optical splitters, wavelength division multiplexers (DWDM), and arraying waveguide gratings (AWG).
Advantages: The combination of high-speed acquisition and large dynamic range can quickly scan the full wavelength response curve of the device, increasing the test throughput by more than three times.
Monitoring of high-speed optical communication systems
Real-time power monitoring of high-speed optical modules such as 400G/800G in data center interconnection (DCI) and 5G fronthaul.
Advantage: The 10KHz refresh rate can capture the transient fluctuations of optical power, providing data support for system stability analysis.